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New method for studying the relationship between morphological pcuameters and cell viability [6150-87]

Author(s):
Xiong, J. ( Xi’an Jiaotong Univ. (China) and South China Normal Univ. (China) )
Dai, W. ( South China Normal Univ. (China) )
Chen, L. ( Guangdong Univ. of Technology (China) )
Liu, G. ( Hunan Shaoyang Univ. (China) )
Liu, M. ( South China Normal Univ. (China) )
Zhang, Z. ( Xi’an Jiaotong Univ. (China) )
Xiao, H. ( South China Normal Univ. (China) )
2 more
Publication title:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6150
Pub. Year:
2006
Pt.:
2
Page(from):
615043
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461896 [081946189X]
Language:
English
Call no.:
P63600/6150
Type:
Conference Proceedings

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