Research on digitally integrated test system for performance evaluation of image intensifier and intensified CCD [6150-163]

Author(s):

• Wang, X. ( Beijing Institute of Technology (China) )
• Jin,W. ( Beijing Institute of Technology (China) )
• Gao,Z. ( Beijing Institute of Technology (China) )
• Wang,Z. ( North NIght Vision Technology Co.. Ltd. (China ) )
• Bai, T. ( Beijing Institute of Technology (China) )

Publication title:

2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6150

Pub. Year:

2006

Pt.:

1

Page(from):

61500S

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461896 [081946189X]

Language:

English

Call no.:

P63600/6150

Type:

Conference Proceedings