Study on precise measurement of high reflectivity by cavity ring-down spectroscopy (Invited Paper) [6150-160]
- Author(s):
Ren, G. ( Sichuan Univ. (China) ) Cai, B. ( Sichuan Univ. (China) ) Zhang, B. ( Sichuan Univ. (China) ) Xiong, S. ( Institute of Optics and Electronics, CAS (China ) ) Huang, W. ( Institute of Optics and Electronics, CAS (China ) ) Gao, L. ( Institute of Optics and Electronics, CAS (China ) ) - Publication title:
- 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6150
- Pub. Year:
- 2006
- Pt.:
- 1
- Page(from):
- 61500O
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461896 [081946189X]
- Language:
- English
- Call no.:
- P63600/6150
- Type:
- Conference Proceedings
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