Method for measuring the granite surface topography of wafer stage with laser interferometer [6150-42]
- Author(s):
- He, L. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) )
- Wang, X. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) )
- Shi, W. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) )
- Hu, J. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) and Chinese Academy of Sciences (China) )
- Publication title:
- 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6150
- Pub. Year:
- 2006
- Pt.:
- 1
- Page(from):
- 615008
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461896 [081946189X]
- Language:
- English
- Call no.:
- P63600/6150
- Type:
- Conference Proceedings
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