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Optical parameters analysis of a semi-conductive film based on genetic algorithm [6150-145]

Author(s):
  • Ning, Y. ( National Univ. of Defense Technology (China) )
  • Ji, J ( National Univ. of Defense Technology (China) )
  • Jiang, Z. ( National Univ. of Defense Technology (China) )
  • Ye, W. ( National Univ. of Defense Technology (China) )
  • Zhao, C. ( National Univ. of Defense Technology (China) )
Publication title:
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6150
Pub. Year:
2006
Pt.:
1
Page(from):
615004
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461896 [081946189X]
Language:
English
Call no.:
P63600/6150
Type:
Conference Proceedings

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