Blank Cover Image

Monte Carlo simulation for the hybrid detector design [6142-189]

Author(s):
Kim, S. Y. ( Inje Univ. (South Korea) )
Park, J. K. ( Inje Univ. (South Korea) )
Kang, S. S. ( Inje Univ. (South Korea) )
Cha, B. Y. ( Inje Univ. (South Korea) )
Cho S. H. ( Inje Univ. (South Korea) )
Jeong, E. S. ( Inje Univ. (South Korea) )
Nam, S. H. ( Inje Univ. (South Korea) )
Lee, H. W. ( Inje Univ. (South Korea) )
Choi, H. K.
4 more
Publication title:
Medical Imaging 2006: Physics of Medical Imaging
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6142
Pub. date:
2006
Pt.:
3
Page(from):
614257
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
1.60574e+007
ISBN:
9780819461858 [0819461857]
Language:
English
Call no.:
P63600/6142
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Quantitative evaluation of mercuric iodide thick film for x-ray imaging device [6142-107]

Kim, K.-J, Kang, S.-S, Park, J.-K, Cho, S-H, Cha, B.-Y, Shin, J.-W, Nam, S.-H, Kim, J.-H

SPIE - The International Society of Optical Engineering
7 Conference Proceedings Validation of ArF chromeless PSM in the sub-100-nm node DRAM cell

Lee, J.-H., Chung, D.-H., Cha, D.-C., Kim, H.-S., Park, J.-S., Nam, D.-G., Woo, S.-K., Cho, H.-S., Han, W.-S.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Determining MTF of digital detector system with Monte Carlo simulation

Jeong, E. S., Lee, H. W., Nam, S. H.

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Development and evaluation of a selenium-based flat-panel digital x-ray detector system based on quality factor

Park, J.K., Choi, J.Y., Kang, S.S., Mun, C.W., Lee, H.W., Nam, S.H.

SPIE-The International Society for Optical Engineering
3 Conference Proceedings Layer-specific illumination optimization by Monte Carlo method

Kim, H.-C., Nam, D.-S., Hwang, C., Kang, Y.S., Woo, S.-G., Cho, H.-K., Han, W.-S.

SPIE-The International Society for Optical Engineering
9 Conference Proceedings EUV mask pattern inspection for memory mask fabrication in 45-nm node and below [6349-95]

Kim, D. Y., Cho, S. Y., Kim, H., Huh, S. M., Chung, D. H., Cha, B. C., Lee, J. W., Choi, S. W., Han, W. S., Park, K. H., …

SPIE - The International Society of Optical Engineering
4 Conference Proceedings The feasibility study of thin Cr film for low process bias

Seo, W.-W., Yoon, S.-Y., Park, D.-I., Park, E.-S., Kim, J.-M., Jeong, S.-M., Choi, S.-S., Cha, H.-S., Nam, K.S.

SPIE-The International Society for Optical Engineering
10 Conference Proceedings A study of storage life extension for high performance chemically amplified resist coated blanks [5853-03]

Yang, S.-J., Seo, S.-M., Ko, S.-H., Cha, H.-S., Kang, G.-W., Nam, K.-S., Seo. W.-W., Jung, W.-K., Cho, H.-K., Kim, …

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Required mask specification for mass production devices below 65-nm design node [6349-81]

Nam, D., Choi, S., Doh, J., Noh, Y., Lee, H., Sin, Y., Kim, B., Kang, M., Han, W.

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Design and analysis of a rotor type mag neto-rheological fluid brake and Clucth [6048-19]

Kang S. B, Jeong H, Shin K. Y, Kim S. T, Cho Y. J, Kang K. T

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Fully optical backplane system using novel optical plug aand slot [6014-19]

Cho I.-K., Ahn S.-H., Lee W.-J., Han S.-H., Kim J.-T., Choi C.-K., Shin K., Yoon K. B., Jeong M.-Y., Park H. H.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings X-ray detection properties of polycrystalline Cd1-xZnxTe detectors for digital radiography

Kang, S.S., Park, J.K., Lee, D.G., Mun, C.W., Kim, J.H., Nam, S.H.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12