Defects and degradation of nitride-based laser diodes (Invited Paper) [6133-08]
- Author(s):
- Tomiya, S ( Sony Corp. (Japan) )
- Hino, T ( Sony Corp. (Japan) )
- Miyajima, T ( Sony Corp. (Japan) )
- Goto, O ( Sony Corp. (Japan) )
- Ikeda, M ( Sony Corp. (Japan) )
- Publication title:
- Novel In-Plane Semiconductor Lasers V
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6133
- Pub. Year:
- 2006
- Page(from):
- 613308
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819461759 [081946175X]
- Language:
- English
- Call no.:
- P63600/6133
- Type:
- Conference Proceedings
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