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High-density parallel optical interconnection for IoTbps interconnection in high-speed memory test systems (Invited Paper) [6124-21]

Author(s):
Okayasu, T. ( Advantest Corp. (Japan) )
Hayase, Y. ( Advantest Corp. (Japan) )
Ono,A. ( Advantest Corp. (Japan) )
Watanabe,D. ( Advantest Corp. (Japan) )
Mori,H. ( The Furukawa Electric Co.. Ltd. (Japan) )
Nomura, T. ( The Furukawa Electric Co.. Ltd. (Japan) )
1 more
Publication title:
Optoelectronic Integrated Circuits VIII
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6124
Pub. Year:
2006
Page(from):
61240M
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819461667 [0819461660]
Language:
English
Call no.:
P63600/6124
Type:
Conference Proceedings

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