Effect of two- and three-zone phase masks on the axial end transverse intensity distribution under high numerical aperture focusing [6110-11]

Author(s):

• Kuebler, S. M. ( College of Optics and Photonics, CREOL, Univ. of Central Florida (USA) and Univ. of Central Florida (USA) )
• Jabbour, T. ( College of Optics and Photonics, CREOL, Univ, of Central Florida (USA) )

Publication title:

Micromachining technology for micro-optics and nano-optics IV : 23-25 January 2006, San Jose California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6110

Pub. Year:

2006

Page(from):

61100B

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461520 [0819461520]

Language:

English

Call no.:

P63600/6110

Type:

Conference Proceedings