Estimating reflectance parameters from saturated spectral images [6062-08]

Estimating reflectance parameters from saturated spectral images [6062-08]

Author(s):

Li, S. Y. ( Nara Institute of Science and Technology (Japan) )
Manabe, Y. ( Nara Institute of Science and Technology (Japan) )
Chihara, K. ( Nara Institute of Science and Technology (Japan) )

Publication title:

Spectral Imaging: Eighth International Symposium on Multispectral Color Science

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

6062

Pub. Year:

2006

Page(from):

606208

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819461025 [0819461024]

Language:

English

Call no.:

P63600/6062

Type:

Conference Proceedings

Details

TDL ID:	ZA00016096
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : International Symposium on Multispectral Color Science
Conf. info. (Number):	2006 : 8th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2006.01.16-2006.01.17

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