Blank Cover Image

Interference characteristic analysis on RoF illumination [6034-62]

Author(s):
Publication title:
ICO20: optical design and fabrication : 21-26 August 2005, Changchun, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6034
Pub. Year:
2006
Page(from):
60341Q
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460653 [0819460656]
Language:
English
Call no.:
P63600/6034
Type:
Conference Proceedings

Similar Items:

Q. Li, W. Feng, C. Wang, Q. Cao, X. Hu, D. Sha, J. Lin, D. Zhu

SPIE - The International Society of Optical Engineering

Zhu, X.J., Qi, X.M., Gao, Y.Q., Yuan, L.H.

SPIE-The International Society for Optical Engineering

Xu, Q., Zeng, X., An, Y., Cao, C., Feng, Z., Wang, Q., Lin, J., Gao, Q.

SPIE - The International Society of Optical Engineering

Su, X., Cao, Y., Xiang, L., Chen, W., Zhang, Q.

SPIE - The International Society of Optical Engineering

Su, X.Y., Cao, Y.P., Xiang, L.Q., Chen, W.J.

SPIE-The International Society for Optical Engineering

Xu, Y., Zhu, X., Ye, X., Kang, X., Cao, Q., Guo, L., Chen, L.

SPIE - The International Society of Optical Engineering

Zhu,W., Zhang,X., Li,X., Chen,Q.

SPIE - The International Society for Optical Engineering

Lin,Q., Jiang,X., Zhu,J., Lu,X., Wang,S.

SPIE-The International Society for Optical Engineering

Cheng X., Xu D, Hao Q.

SPIE - The International Society of Optical Engineering

Sun, Y., Jiang, X.-Q., Yang, J.-Y., Wang, M.-H.

SPIE - The International Society of Optical Engineering

Gu,Q., Cao,J., Sun,Y.

SPIE-The International Society for Optical Engineering

B. Zhu, Z. Yuan, J. Zhang

Society of Photo-optical Instrumentation Engineers

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12