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Packaged MEMS and MOEMS measurement using through-transmissive-media (TTM) profiler [6032-03]

Author(s):
Han, S. ( Veeco Metrology (USA) )  
Publication title:
ICO20 : MEMS, MOEMS, and NEMS : 21-26 August, 2005, Changchun, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6032
Pub. Year:
2006
Page(from):
603203
Page(to):
603203
Pages:
1
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460639 [081946063X]
Language:
English
Call no.:
P63600/6032
Type:
Conference Proceedings

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