Resilience in all-optical label switching networks: a node dimensioning point of view [6022-79]
- Author(s):
- Van Caenegem R.
- Colle D.
- Pickavet M.
- Demeester P. ( Ghent Univ. (Belgium) )
- Publication title:
- Network Architectures, Management, and Applications III
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 6022
- Pub. Year:
- 2005
- Pt.:
- 1
- Page(from):
- 602228
- Page(to):
- 602228
- Pages:
- 1
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819460530 [0819460532]
- Language:
- English
- Call no.:
- P63600/6022
- Type:
- Conference Proceedings
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