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The reliability of the elastic strain fields for different structure of complex self-organized low-dimension quantum wire and system [6020-70]

Author(s):
Wang X.
Guo W.
Tian Y.
Guo X.
Gao G.
Shen G. ( Beijing Univ. of Technology (China) and Beijing Optoelectronic Technology Lab. (China) )
1 more
Publication title:
Optoelectronic Materials and Devices for Optical Communications
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6020
Pub. Year:
2005
Page(from):
60201X
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460516 [0819460516]
Language:
English
Call no.:
P63600/6020
Type:
Conference Proceedings

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