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New characterization methods for semiconductor laser (Invited Paper) [6013-23

Author(s):
Tomm, W. J.
Weik, F. ( Max-Born-Institut fur Nichtlineare Optik und kurzzeitspektroskopie (Germany) )
Kozlowska, A.
Latoszek, M. ( Institute of Electronic Materials Technology (Poland) )
Bugajski, M.
Zbroszczyk, M. ( Institute of Elactron Technology (Poland) )
1 more
Publication title:
Optoelectronic Devices: Physics, Fabrication, and Application II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6013
Pub. Year:
2005
Page(from):
60130M
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460370 [0819460370]
Language:
English
Call no.:
P63600/6013
Type:
Conference Proceedings

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