Blank Cover Image

Acoustic thermography using an uncooled high-speed camera and low-power ultrasonic excitation: test system and its application to impact flaw detection in CFRP [6179-03]

Author(s):
  • Haupt, L. ( Fraunhofer Institute for Non-Destructive Testing, Dresden (Germany) )
  • Zimmerhackl. M ( DIAS Infrared Systems GmbH (Germany) )
  • Meyendorf, N ( Fraunhofer Institute for Non-Destructive Testing, Dresden (Germany) )
  • Kohler, B. ( Fraunhofer Institute for Non-Destructive Testing, Dresden (Germany) )
Publication title:
Advanced sensor technologies for nondestructive evaluation and structural health monitoring II : 1-2 March 2006, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
6179
Pub. Year:
2006
Page(from):
617903
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819462329 [0819462322]
Language:
English
Call no.:
P63600/6179
Type:
Conference Proceedings

Similar Items:

D.P. Chen, N.M. Wu, Z. Zhang, Y. Li, X.X. Li

Trans Tech Publications

Ian Atkinson, Chris Gregory, Stephen P. Kelly, Katherine J. Kirk

American Society of Mechanical Engineers

Kohler, B., Schubert, F., Hentges, G., Meyendorf, N.

SPIE - The International Society of Optical Engineering

Shirmohamadi, Manuchehr, Finnie, Shauna, Foster, Chuck

The American Society of Mechanical Engineers

Meyendorf, N., Berthold, A.

SPIE - The International Society of Optical Engineering

Rosner,H., Sathish,S., Meyendorf,N.

SPIE-The International Society for Optical Engineering

A. Striegler, B. Kohler, B. Bendjus, N. Pathuri, N. Meyendorf

SPIE - The International Society of Optical Engineering

N. Kislov, M. Sarehraz, E. Stefanakos

SPIE - The International Society of Optical Engineering

Schimert,T.R., Ratcliff,D.D., Brady,J.F., Ropson,S.J., Gooch,R.W., Ritchey,B., McCardel,P., Rachels,K., Wand,M., …

SPIE - The International Society for Optical Engineering

Schimert,T.R., Cunningham,N., Francisco,G., Gooch,R.W., Gooden,J., McCardel,P., Neal,B.E., Ritchey,B., Rife,J., …

SPIE-The International Society for Optical Engineering

Xiang, N., Sabatier, J. M.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12