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Improved modeling of fogging and loading effect correction [5992-165]

Author(s):
Lee, S.
Kim, B.
Han, H.
Nam, D.
Moon, S.
Choi, S.
Han, W. ( Samsung Electronics Co., Ltd. (South Korea) )
2 more
Publication title:
25th Annual BACUS Symposium on Photomask Technology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5992
Pub. Year:
2005
Pt.:
2
Page(from):
59924U
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819460141 [0819460141]
Language:
English
Call no.:
P63600/5992
Type:
Conference Proceedings

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