The detectability of Qz phase defects and its application for 65 nm node CPL mask manufacturing [5992-05]
- Author(s):
- Cho, W. I.
- Park, J. H.
- Chung, D. H.
- Choi, S. W.
- Han, W. S. ( Samsung Electronics Co., Ltd. (South Korea) )
- Publication title:
- 25th Annual BACUS Symposium on Photomask Technology
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5992
- Pub. Year:
- 2005
- Pt.:
- 1
- Page(from):
- 599205
- Page(to):
- 599205
- Pages:
- 1
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819460141 [0819460141]
- Language:
- English
- Call no.:
- P63600/5992
- Type:
- Conference Proceedings
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