Analytically derived thermal correction to reduce overlap bias errors in micro-pulse lidar data [5984-31]

Analytically derived thermal correction to reduce overlap bias errors in micro-pulse lidar data [5984-31]

Author(s):

Berkoff, T. A. ( NASA Goddard Space Flight Ctr. (USA) )

Ji, Q. ( NASA Goddard Space Flight Ctr. (USA) and Univ. of Maryland (USA) )

Reid, E. ( Naval Research Lab. (USA) )

Valencia, S. ( SSAI Inc. (USA) and NASA Goddard Space Flight Ctr. (USA) )

Welton, J.

Spinhirne, J. D. ( NASA Goddard Space Flight Ctr. (USA) )

1 more

Publication title:

Lidar technologies, techniques, and measurements for atmospheric remote sensing : 19-20 September 2005, Bruges, Belgium

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5984

Pub. Year:

2005

Page(from):

59840R

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819460042 [0819460044]

Language:

English

Call no.:

P63600/5984

Type:

Conference Proceedings

Details

TDL ID:	ZA00016021
Series ID:	PA00000029
Conf. info. (Name):	SPIE Remoto Sensing : Lidar technologies, techniques, and measurements for atmospheric remote sensing
Conf. info. (Number):	2005
Conf. info. (Venue):	Bruges, Belgium
Conf. info. (Date):	2005.09.19-2005.09.20

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