On reliability of submicron and nanoelectronic devices [5972-45]

Author(s):

Bacivarov, A. ( Univ. Politehnica Bucharest (Romania) )  

Publication title:

Advanced topics in optoelectronics, microelectronics, and nanotechnologies II : 24-26 November, 2004, Bucharest, Romania

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5972

Pub. Year:

2005

Page(from):

597219

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459916 [0819459917]

Language:

English

Call no.:

P63600/5972

Type:

Conference Proceedings