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Gaussian diffraction model for Sb thin films in super-resolution near-field structure [5966-46]

Author(s):
  • Qu, Q.
  • Wang, Y. ( Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China) )
  • Ren, L. ( Xi’an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences (China) )
  • Wei, J.
  • Gan, F. ( Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China) )
Publication title:
Seventh International Symposium on Optical Storage (ISOS 2005)
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5966
Pub. Year:
2005
Page(from):
59661A
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819459848 [0819459844]
Language:
English
Call no.:
P63600/5966
Type:
Conference Proceedings

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