Static recording characteristics of super-resolution near-field structure with bismuth mask layer [5966-45]

Static recording characteristics of super-resolution near-field structure with bismuth mask layer [5966-45]

Author(s):

Zhang, F.
Wang, Y.
Xu, W.
Gao, X.
Gan, F. ( Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China) )

Publication title:

Seventh International Symposium on Optical Storage (ISOS 2005)

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5966

Pub. Year:

2005

Page(from):

596619

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459848 [0819459844]

Language:

English

Call no.:

P63600/5966

Type:

Conference Proceedings

Details

TDL ID:	ZA00016003
Series ID:	PA00000029
Conf. info. (Name):	ISOS - International Symposium on Optical Storage
Conf. info. (Number):	2005 : 7th
Conf. info. (Venue):	Zhanjiang, China
Conf. info. (Date):	2005.04.02-2005.04.06

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