Blank Cover Image

Micro-optics: manufacturing and characterization (Invited Paper) [5965-01]

Author(s):
Publication title:
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5965
Pub. Year:
2005
Page(from):
596501
Page(to):
596501
Pages:
1
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819459831 [0819459836]
Language:
English
Call no.:
P63600/5965
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Refractive microlenses for ultraflat photolithographic projection systems

Voelkel,R., Eisner,M., Ossmann,C., Weible,K.J.

SPIE-The International Society for Optical Engineering
7 Conference Proceedings Advantages of micro-optics over holograms for document authentication (Invited Paper)

Steenblik, R.A., Hurt, M.J ., Knotts, M.E.

SPIE-The International Society for Optical Engineering
2 Conference Proceedings Fabrication of aspherical microlenses in fused silica and silicon

Voelkel,R., Eisner,M., Weible,K.J.

SPIE-The International Society for Optical Engineering
8 Conference Proceedings Benchmarking instrumentation tools for the characterization of microlenses within the EC Network of Excellence on Micro-Optics (NEMO)

H. Ottevaere, J. Schwider, J. Kacperski, L. Steinbock, K. Weible

Society of Photo-optical Instrumentation Engineers
3 Conference Proceedings Laser beam homogenizing: limitations and constraints

R. Voelkel, K. J. Weible

Society of Photo-optical Instrumentation Engineers
9 Conference Proceedings Micro-optic measurement techniques and instrumentation in the European Network of Excellence for Micro-Optics (NEMO) (Invited Paper) [5858-01]

Kujawinska, M., Gorecki, C., Ottevaere, H., Szczepanski, P., Thienpont, H.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings Manufacturing and testing of precision optical components: from substrate to coating and assembling (Invited Paper) [5965-17]

Netterfield,. R., Oreb, B., Leistner, A., Green, K., Seckold, J., Gross, M.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings Resolution characteristics of afocal array optics (Invited Paper) [6016-01]

Okano F., Arai J., Okui M.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings Microlens laser beam homogenizer: from theory to application

M. Zimmermann, N. Lindlein, R. Voelkel, K. J. Weible

Society of Photo-optical Instrumentation Engineers
11 Conference Proceedings Atoms, optics, and molecules on chips (Invited Paper) [6131-01]

Tscherneck, M., Kleinert, J., Haimberger, C., Holmes, M., Wakim, A., Quinto-Su, P, Bigelow, N. P.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Metrology of refractive microlens arrays

Weible, K. J., Volkel, R., Eisner, M., Hoffmann, S., Scharf, T., Herzig, H. -P.

SPIE - The International Society of Optical Engineering
12 Conference Proceedings Improving metrology for micro-optics manufacturing (Invited Paper)

Davies, A.D., Bergner, B.C., Gardner, N.W.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12