Restitution of the technological parameters of a 320x240 MCT LWIR focal plane array by spectrometric measurements [5964-12]
- Author(s):
Rommeluere, S. Guerineau, N. Deschamps, J. ( ONERA (France) ) De Borniol, E. Millon, A. Chamonal, J. -P. Destefanis, G. ( CEA/LETI (France) ) - Publication title:
- Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5964
- Pub. Year:
- 2005
- Page(from):
- 59640E
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819459824 [0819459828]
- Language:
- English
- Call no.:
- P63600/5964
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Microspectrometer on a chip (MICROSPOC): first demonstration on a 320x240 LWIR HgCdTe focal plane array
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Experimental evaluation of the modulation transfer function of an infrared focal plane array using the Talbot effect
SPIE - The International Society for Optical Engineering |
2
Conference Proceedings
Infrared focal plane array modeling for aerospace and automotive applications
SPIE - The International Society of Optical Engineering |
8
Conference Proceedings
Hyperspectral study of a 640x512 infrared focal plane array of QWIP technology
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
4
Conference Proceedings
Modulation transfer function measurement of an infrared focal plane array using a nondiffracting array generator
SPIE-The International Society for Optical Engineering |
10
Conference Proceedings
MICROCARD: a micro-camera based on a circular diffraction grating for MWIR and LWIR imagery
Society of Photo-optical Instrumentation Engineers |
5
Conference Proceedings
Long linear MWIR and LWIR HgCdTe infrared detection arrays for high-resolution imaging
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |