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Restitution of the technological parameters of a 320x240 MCT LWIR focal plane array by spectrometric measurements [5964-12]

Author(s):
Rommeluere, S.
Guerineau, N.
Deschamps, J. ( ONERA (France) )
De Borniol, E.
Millon, A.
Chamonal, J. -P.
Destefanis, G. ( CEA/LETI (France) )
2 more
Publication title:
Detectors and associated signal processing II : 13-14 September 2005, Jena, Germany
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5964
Pub. Year:
2005
Page(from):
59640E
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819459824 [0819459828]
Language:
English
Call no.:
P63600/5964
Type:
Conference Proceedings

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