Soft x-ray resonant diffraction in transition metal oxides [5932-80]

Soft x-ray resonant diffraction in transition metal oxides [5932-80]

Author(s):

Hill, J. P. ( Brookhaven National Lab. (USA) )

Chou, F. C. ( Massachusetts Institute of Technology (USA) and National Taiwan Univ. (Taiwan) )

Tomioka, Y. ( Correlated Electron Research Ctr., AIST (Japan) )

Tokura, Y. ( Correlated Electron Research Ctr., AIST (Japan), Univ. of Tokyo (Japan), and Japan Science and Technology Corp. (Japan) )

Abbamonte, P. ( Brookhaven National Lab. (USA) )

2 more

Publication title:

Strongly correlated electron materials : physics and nanoengineering : 31 July-4 August, 2005, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5932

Pub. Year:

2005

Page(from):

59322A

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459374 [0819459372]

Language:

English

Call no.:

P63600/5932

Type:

Conference Proceedings

Details

TDL ID:	ZA00015969
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Strongly correlated electron materials
Conf. info. (Number):	2005
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2005.07.31-2005.08.04

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