New growth method of high-quality multicomponent oxide thin films used in strongly correlated electron device applications: impurity-precipitate issues and their problem solving [5932-35]

Author(s):

• Endo, K. ( NeRl, National Institute of Advanced Industrial Science and Technology (Japan) )
• Badica, P. ( Tohoku Univ. (Japan) and National Institute of Materials Physics (Romania) )
• Sato, H.
• Akoh, H. ( CERC, National Institute of Advanced Industrial Science and Technology (Japan) )

Publication title:

Strongly correlated electron materials : physics and nanoengineering : 31 July-4 August, 2005, San Diego, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5932

Pub. Year:

2005

Page(from):

593211

Page(to):

593212

Pages:

2

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459374 [0819459372]

Language:

English

Call no.:

P63600/5932

Type:

Conference Proceedings