Characterization of optical traps using on-line estimation methods [5930-73]

Characterization of optical traps using on-line estimation methods [5930-73]

Author(s):

Gorman, J. J.
LeBurn, T. W.
Balijepalli, A.
Cagnon, C.
Lee, D. ( National Institute of Standards and Technology (USA) )

Publication title:

Optical Trapping and Optical Micromanipulation II

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5930

Pub. Year:

2005

Page(from):

593023

Page(to):

593023

Pages:

1

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459350 [0819459356]

Language:

English

Call no.:

P63600/5930

Type:

Conference Proceedings

Details

TDL ID:	ZA00015967
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Optical Trapping and Optical Micromanipulation
Conf. info. (Number):	2005 : 2nd
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2005.07.31-2005.08.04

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