Blank Cover Image

Performance studies of CdZnTe detector by using a pulse shape analysis (Invited Paper) [5922-19]

Author(s):
Bolotnikov, A. E.
Camarada, G. S.
Carini, G. A. ( Brtookhaven National Lab. (USA) )
Fiederie, M. ( Albert-Ludwigs Univ. Frieburg (Germany) )
Li, L. ( Yinnel Tech Inc. (USA) )
Wright, G. W. ( Oak Ridge National Lab. (USA) )
James, R. B. ( Brookhaven National Lab. (USA) )
2 more
Publication title:
Hard X-ray and gamma-ray detector physics VII : 1-3 August 2005, San Diego, California
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5922
Pub. Year:
2005
Page(from):
59220K
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819459275 [0819459275]
Language:
English
Call no.:
P63600/5922
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings The effects of precipitates on CdZnTe device performance [5922-04]

Camarda, G. S., Bolotnikov, A. E., Carini, G. A., Li, L., Wright, G. W., James, R. B.

SPIE - The International Society of Optical Engineering
7 Conference Proceedings Study of growth defects in CZT and their influence on detector uniformity

Camarda, G.S., Carini, G.A., Zhong, Z., Siddons, D.P., Bolotnikov, A.E., Wright, G.W., James, R.B.

SPIE - The International Society of Optical Engineering
2 Conference Proceedings New results from testing of coplanar-grid CdZnTe detectors [5922-22]

Carini, G. A., Bolotnikov, A. E., Camarada, G. S., De Geronimo, G., Siddons, D. P., Wright, G. W., James, R. B.

SPIE - The International Society of Optical Engineering
8 Conference Proceedings Use of a pulsed laser to study properties of CdZnTe pixel detectors

Bolotnikov,A.E., Boggs,S.E., Cook,W.R., Harrison,F.A., Schindler,S.M.

SPIE - The International Society for Optical Engineering
3 Conference Proceedings Te inclusions and their relationship to the performance of CdZnTe detectors (Invited Paper) [6319A-05]

Carini, G. A., Bolotnikov, A. E., Camarda, G. S., Cui, Y., Jackson, H., Burger, A., Kohman, K. T., Li, L., James, R. B.

SPIE - The International Society of Optical Engineering
9 Conference Proceedings Characterization of coplanar grid CZT detectors with highly collimated x-ray beam

Carini, G.A., Bolotnikov, A.E., Camarda, G.S., Wright, G.W., De Geronimo, G., Siddons, D.P., James, R.B.

SPIE - The International Society of Optical Engineering
4 Conference Proceedings New results from performance studies of Frisch-grid CdZnTe detectors (Invited Paper)

Bolotnikov, A.E., Camarda, G.S., Carini, G.A., Wright, G.W., McGregor, D.S., McNeil, W., James, R.B.

SPIE - The International Society of Optical Engineering
10 Conference Proceedings High spatial-resolution imaging of Te inclusions in CZT material [6319A-31]

Camarda, G. S., Bolotnikov, A. E., Carini, G. A., Cui, Y., Kohman, K. T., Li, L., James, R. B.

SPIE - The International Society of Optical Engineering
5 Conference Proceedings The effects of Te precipitates on measurable characteristics of CdZnTe detectors [6319A-02]

Bolotnikov, A. E., Black, M., Camarda, G. S., Carini, G. A., Cui, Y., Kohman, K. T., Li, L., Salomon, M. B., James, R. …

SPIE - The International Society of Optical Engineering
11 Conference Proceedings Effects of material improvement on CZT detectors [6319A-04]

Chu, M., Terterian, S., Ting, D., Carini, G. A., Camarda, G. S., Bolotnikov, A. E., James, R. B., Xu, D., He, Z.

SPIE - The International Society of Optical Engineering
6 Conference Proceedings Development of a large single-crystal (3-inch ingot) CdZnTe for large-volume nuclear radiation detectors (Invited Paper)

Li, L., Lu, F., Lee, C., Wright, G.W., Rhiger, D.R., Sen, S., Shah, K.S., Squillante, M.R., Cirignano, L.J., James, …

SPIE-The International Society for Optical Engineering
12 Conference Proceedings Optical studies of the internal electric field distributions,crystal defects,and detector performance of CdZnTe radiation detectors (Invited Paper)

Yao,H.W., James,R.B., Lee,E.Y., Olsen,R.W., Hermon,H., Anderson,R.J.

SPIE-The International Society for Optical Engineering
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12