Advanced optical damage studies using x-ray interferometric microscopy [5919-21]

Advanced optical damage studies using x-ray interferometric microscopy [5919-21]

Author(s):

Rus, B. ( Institute of Physics (Czech Republic); )

Jamelot, G. ( Univ. Pari-Sud (France); )

Bercegol. H. ( Commissariat a I’Energie Atomique (France); )

Stupka, M. ( Institute of Physics (Czech Republic); )

Cassou, K.

Kazamias, S.

Klisnick, A.

Ros, D. ( Univ. of Paris-Sud (France); )

Danson, C.

Hawkes, S. ( Rutherford Appleton Lab. (United Kingdom) )

9 more

Publication title:

Soft X-Ray Lasers and Applications VI

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5919

Pub. Year:

2005

Page(from):

59190K

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459244 [0819459240]

Language:

English

Call no.:

P63600/5919

Type:

Conference Proceedings

Details

TDL ID:	ZA00015957
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Soft X-Ray Lasers and Applications
Conf. info. (Number):	2005 : 6th
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2005.08.02-2005.08.03

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