Myriad-based shift parameter estimation method and its application to image filtering and processing [5916-01]

Myriad-based shift parameter estimation method and its application to image filtering and processing [5916-01]

Author(s):

Lukin, V. V.
Abramov, S. K.
Zelensky, A. A. ( National Aerospace Univ. (Ukraine); )
Astola, J. T. ( Tampere Univ. of Technology (Finland) )

Publication title:

Mathematical Methods in Pattern and Image Analysis

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5916

Pub. Year:

2005

Page(from):

591601

Page(to):

591601

Pages:

1

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819459213 [0819459216]

Language:

English

Call no.:

P63600/5916

Type:

Conference Proceedings

Details

TDL ID:	ZA00015954
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Mathematical Methods in Pattern and Image Analysis
Conf. info. (Number):	2005
Conf. info. (Venue):	San Diego, CA, USA
Conf. info. (Date):	2005.08.03-2005.08.04

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