Automatic inspection of pavement cracking distress [5909-01]
- Author(s):
- Publication title:
- Applications of digital image processing XXVIII : 2-4 August 2005, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5909
- Pub. Year:
- 2005
- Page(from):
- 590901
- Page(to):
- 590901
- Pages:
- 1
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819459145 [0819459143]
- Language:
- English
- Call no.:
- P63600/5909
- Type:
- Conference Proceedings
Similar Items:
SPIE |
7
Conference Proceedings
Automatic optimization of MEEF-driven defect disposition for contamination inspection challenges
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Automatic inspection tool sensitivity with characterization of AAPSM defects
SPIE-The International Society for Optical Engineering | |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Automated real-time pavement distress detection using fuzzy logic and neural network
SPIE-The International Society for Optical Engineering |