Blank Cover Image

Modeling the alternate bias configuration and low temperature C-V profiling in blocked impurity band detectors [5883-28]

Author(s):
Publication title:
Infrared spaceborne remote sensing 2005 : 3-4 August 2005, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5883
Pub. Year:
2005
Page(from):
58830R
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458889 [0819458880]
Language:
English
Call no.:
P63600/5883
Type:
Conference Proceedings

Similar Items:

Reichertz, L. A., Cardozo, B. L., Beernan, J. W., Larsen, D. I., Tschanz, S., Jakob, G., Katterloher, R., Haegel, N. M., …

SPIE - The International Society of Optical Engineering

S. M. Birkmann, J. Stegmaier, U. Grözinger, O. Krause, T. Souverijns

Society of Photo-optical Instrumentation Engineers

Haegel, N.M., Jacobs, J.E., Simoes, J.C., White, A.M.

SPIE

D. S. Tezcan, J. Putzeys, K. De Munck, T. Souverijns, P. Merken

Society of Photo-optical Instrumentation Engineers

Olsen, C. S., Beeman, J. W., Hansen, W. L., Haller, E. E.

MRS - Materials Research Society

Stapelbroek, M.G., Atkins, E.W.

SPIE-The International Society for Optical Engineering

H. H. Hogue, M. T. Guptill, J. C. Monson, J. W. Stewart, J. E. Huffman

Society of Photo-optical Instrumentation Engineers

J. Wolf, L. Wiest, U. Grözinger, D. Lemke, J. Schubert

Society of Photo-optical Instrumentation Engineers

Carter,A.C., Lorentz,S.R., Jung,T.M., Klemme,B.J., Datla,R.U.

SPIE - The International Society for Optical Engineering

Abedin, M. N., Refaat, T. F., Xiao, Y., Bhat, I.

SPIE - The International Society of Optical Engineering

Olsen,C. S., Beeman,J.W., Haller,E. E.

SPIE-The International Society for Optical Engineering

Haegel, N.M.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12