Pre-flight performance characterization of RazakSAT medium-sized aperture camera (MAC) [5882-06]
- Author(s):
Choi, Y.-W. Kim, E. D. Kang, M.-S. Jeong, S.-K. Yang, S. Kim, J. Kim, E.-E. Park, S.-D. ( Satrec Initiative (South Korea) ) Yang, H.-S. ( Korea Research Institute of Standards and Science (South Korea) ) Afiq bin Ismail, A. M. Arshad, A. S. ( Astronautic Technology (Malaysia) ) - Publication title:
- Earth observing systems X : 31 July-1 August 2005, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5882
- Pub. Year:
- 2005
- Page(from):
- 588205
- Page(to):
- 588205
- Pages:
- 1
- Pub. info.:
- Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819458872 [0819458872]
- Language:
- English
- Call no.:
- P63600/5882
- Type:
- Conference Proceedings
Similar Items:
Society of Photo-optical Instrumentation Engineers |
SPIE-The International Society for Optical Engineering |
ESA Publications Division |
8
Conference Proceedings
The study for close correlation of mask and wafer to optimize wafer field CD uniformity
Society of Photo-optical Instrumentation Engineers |
3
Conference Proceedings
Lessons learned from the optics and local plane alignment of a wide field of view RC telescope [5877-12]
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Characteristics of residues and optical change of HT PSM during stepwise west cleaning and optimization of HT PSM cleaning process
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
90-nm-node CD uniformity improvement using a controlled gradient temperature CAR PEB process
SPIE-The International Society for Optical Engineering |