Blank Cover Image

A new multispectral detector of crop growth condition based on fiber optics [5881-18]

Author(s):
Publication title:
Infrared and photoelectronic imagers and detector devices : 31 July - 1 August 2005, San Diego, California, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5881
Pub. Year:
2005
Page(from):
58810K
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458865 [0819458864]
Language:
English
Call no.:
P63600/5881
Type:
Conference Proceedings

Similar Items:

Li, M., Zhang, X., Zhang, Y., Zhao, P., Zhang, J.

SPIE - The International Society of Optical Engineering

X. Yang, X. Mu, D. Wang, Z. Li, W. Zhang, G. Yan

SPIE - The International Society of Optical Engineering

Li, M.

SPIE - The International Society of Optical Engineering

L. Zhang, X. Li, J. Yu

SPIE - The International Society of Optical Engineering

Z. Zhang, M. Li, R. Zhao, X. Li

Society of Photo-optical Instrumentation Engineers

Han, Y., Li, M., Jia, L., Zhang, X., Zhang, F

SPIE - The International Society of Optical Engineering

X. Li, M. Li, D. Cui

Society of Photo-optical Instrumentation Engineers

M. Zhang, X. Gu, Z. Chen, X. Li, M. Su

SPIE - The International Society of Optical Engineering

C. Yang, M. Li, D. Cui

Society of Photo-optical Instrumentation Engineers

Zhang,X., Zhang,K., Wang,S.

SPIE-The International Society for Optical Engineering

Zhang, Y., Li, M., Xu, Z., Zhang, X., Wang, M.

SPIE - The International Society of Optical Engineering

Lu, W., Zhang, Z., Yu, X., Li, M.

SPIE - The International Society of Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12