Simultaneous measurement of a profile shape and deformation of an object by processing projected pattern and texture pattern [5880-03]

Author(s):

• Yoshizawa, T.
• Yamamoto, M.
• Ikeda, T. ( Univ. of Agriculture and Technology (Japan) )

Publication title:

Optical Diagnostics

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5880

Pub. Year:

2005

Page(from):

588003

Page(to):

588003

Pages:

1

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458858 [0819458856]

Language:

English

Call no.:

P63600/5880

Type:

Conference Proceedings