Effects of birefringence on Fizeau interferometry that uses polarization phase shifting technique [5869-37]
- Author(s):
- Zhao, C.
- Kang, D.
- Burge, J. H. ( College of Optical Sciences/Univ. of Arizona (USA) )
- Publication title:
- Optical manufacturing and testing VI : 31 July-1 August 2005, San Diego, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5869
- Pub. Year:
- 2005
- Page(from):
- 58690X
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819458742 [0819458740]
- Language:
- English
- Call no.:
- P63600/5869
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Surface evaluation combining the moire effect and phase-stepping techniques in Fizeau interferometry
SPIE-The International Society for Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
8
Conference Proceedings
Simple lateral shearing interferometer using phase-shifting interferometry technique
SPIE-The International Society for Optical Engineering |
3
Conference Proceedings
Figure measurement of a large optical flat with a Fizeau interferometer and stitching technique [6293-21]
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Use of computer generated holograms for alignment of complex null correctors [6273-112]
SPIE - The International Society of Optical Engineering |
4
Conference Proceedings
Testing an off-axis parabola with a CGH and a spherical mirror as null lens [5869-41]
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
Birefringence measurement by scattered light method with a phase-shifting technique
SPIE - The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |