High-speed and line-feed Fourier domain optical coherence tomography (Invited Paper) [5856-31]

High-speed and line-feed Fourier domain optical coherence tomography (Invited Paper) [5856-31]

Author(s):

Yasuno, Y.

Yatagai, T. ( Univ. of Tsukuba (Japan) )

3 more

Publication title:

Optical Measurement Systems for Industrial Inspection IV

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5856

Pub. Year:

2005

Pt.:

1

Page(from):

307

Page(to):

311

Pages:

5

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458568 [0819458562]

Language:

English

Call no.:

P63600/5856

Type:

Conference Proceedings

Details

TDL ID:	ZA00015895
Series ID:	PA00000029
Conf. info. (Name):	Optical Metrology : Optical Measurement Systems for Industrial Inspection
Conf. info. (Number):	2005 : 4th
Conf. info. (Venue):	Munich, Germany
Conf. info. (Date):	2005.06.13-2005.06.17

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