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Grid-pattern design for fast scene reconstruction by a 3D vision sensor [5856-80]

Author(s):
  • Guan, Q. ( Zhejiang Univ. of Technology (China) )
  • Chen, S. ( Zhejiang Univ. of Technology (China) and Institute of Automation, CAS (China) )
  • Wang, W. ( Zhejiang Univ. of Technology (China) )
  • Li, Y. F. ( City Univ. of Hong Kong (Hong Kong China) )
Publication title:
Optical Measurement Systems for Industrial Inspection IV
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5856
Pub. Year:
2005
Pt.:
1
Page(from):
201
Page(to):
209
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458568 [0819458562]
Language:
English
Call no.:
P63600/5856
Type:
Conference Proceedings

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