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Novel real-time infrared image processor with ADSP [5856-77]

Author(s):
Ge, C. ( Univ. of Electric and Scientific Technology of China (China) and Institute of Applied Electronics, CAEP (China) )
Fan, G.
Liu, Z.
Li, Z.
Wu, J.
Huang, Z. ( Institute of Applied Electronics, CAEP (China) )
Liang, Z. ( Univ. of Electronic Science and Technology of China (China) )
2 more
Publication title:
Optical Measurement Systems for Industrial Inspection IV
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5856
Pub. Year:
2005
Pt.:
1
Page(from):
179
Page(to):
183
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458568 [0819458562]
Language:
English
Call no.:
P63600/5856
Type:
Conference Proceedings

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