Full-field low-frequency heterodyne interferometry using CMOS and CCD cameras with online phase processing [5856-02]

Full-field low-frequency heterodyne interferometry using CMOS and CCD cameras with online phase processing [5856-02]

Author(s):

Lakestani, F.
Whelan, M. P. ( European Commission Joint Research Ctr. (Italy) )
Garvey, J.
Newport, D. ( Univ. of Limerick (Ireland) )

Publication title:

Optical Measurement Systems for Industrial Inspection IV

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5856

Pub. Year:

2005

Pt.:

1

Page(from):

23

Page(to):

31

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819458568 [0819458562]

Language:

English

Call no.:

P63600/5856

Type:

Conference Proceedings

Details

TDL ID:	ZA00015895
Series ID:	PA00000029
Conf. info. (Name):	Optical Metrology : Optical Measurement Systems for Industrial Inspection
Conf. info. (Number):	2005 : 4th
Conf. info. (Venue):	Munich, Germany
Conf. info. (Date):	2005.06.13-2005.06.17

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