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Profile measurement of microwave antenna using close range photogrammetry [5852-81]

Author(s):
  • Lu, N.
  • Deng, W. ( Beijing Institute of Machinery (China) )
  • Wang, Y. ( Beijing Univ. of Posts and Telecommunications (China) )
  • Dong, M. ( Beijing Institute of Machinery (China) )
Publication title:
Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5852
Pub. Year:
2005
Pt.:
2
Page(from):
508
Page(to):
514
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819458520 [081945852X]
Language:
English
Call no.:
P63600/5852
Type:
Conference Proceedings

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