Blank Cover Image

Electricall Active Interface and Bulk SemiconductorDefects in High-k/Germanium Structures

Author(s):
Dimoulas, A.  
Publication title:
Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
220
Pub. Year:
2006
Page(from):
237
Page(to):
249
Pages:
13
Pub. info.:
Dordrecht: Springer
ISBN:
9781402043659 [1402043651]
Language:
English
Call no.:
N17050/220
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings CHARACTERIZATION OF PSEUDOMORPHIC HEMT STRUCTURES BY MODULATION SPECTROSCOPY

Dimoulas, A., Zekentes, K., Androulidaki, M.

MRS - Materials Research Society
7 Conference Proceedings Structural Quality and Electrical Behavior of Epitaxial High-k Y2O3/Si(001)

Vellianitis, G., Apostolopoulos, G., Dimoulas, A., Argyropoulos, K., Mereu, B., Scholz, R., Alexe, M., Hooker, J.C.

Materials Research Society
2 Conference Proceedings ATOMIC STRUCTURE OF 60° DISLOCATION IN BULK SILICON AND GERMANIUM, AND AT Ge/Si INTERFACE

Nandedkar, A. S., Narayan, J.,

Materials Research Society
8 Conference Proceedings Germanium Incorporation during PVT Bulk Growth of Silicon Carbide

P. Hens, U. Kunecke, K. Konias, R. Hock, P.J. Wellmann

Trans Tech Publications
3 Conference Proceedings High Temperature Thermoelectric Properties of Nano-Bulk Silicon and Silicon Germanium

Jean-Pierre Fleurial, Sabah Bux, Richard G. Blair, Pawan K. Gogna, Thierry Caillat, Richard B. Kaner

Materials Research Society
9 Conference Proceedings Dopant Activation in Bulk Germanium and Germanium-on-Insulator

Chao, Y. L., Prussin, S., Woo, J. C. S., Scholz, R.

Materials Research Society
4 Conference Proceedings Structural Quality and Electrical Behavior of Epitaxial High-k Y2O3/Si(001)

Vellianitis, G., Apostolopoulos, G., Dimoulas, A., Argyropoulos, K., Mereu, B., Scholz, R., Alexe, M., Hooker, J. C.

Materials Research Society
10 Conference Proceedings Gate Dielectrics for High Mobility Semiconductors

A. Dimoulas, Y. Panayiotatos, P. Tsipas, S. Galata, G. Mavrou

Electrochemical Society
5 Conference Proceedings Electrically Active Interface Defects in Si/SiO2 and Si(100)/HfO2 Structures

Hurley, P.K., O'Sullivan, B.J.

Electrochemical Society
11 Conference Proceedings Germanium on SiC(0001): Surface Structure and Nanocrystals

Schroeter, B., Komlev, K., Kaiser, U., Hess, G., Kipshidze, G., Richter, W.

Trans Tech Publications
6 Conference Proceedings High-Performance Cu-Metallized GaAs HEMTs Processing and Reliability

Feng, T., Dimoulas, A., Strifas, N., Christou, A.

MRS - Materials Research Society
12 Conference Proceedings High-Resolution Interface Atomic Structure Analysis in Silicon Nitride Ceramics

Ziegler, A., Idrobo, J. C., Cinibulk, M. K., Kisielowski, C., Browning, N. D., Ritchie, R. O.

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12