Defect-related Issues in High-Dielectics
- Author(s):
Pantelides, S. T Evans, M. H Fleetwood, D. M Gusev, E. P Joannopoulos, J. D Lu, Z Pennycook, S. J Rashkeev, S. N Schrimpf, R. D Tsetseris, L - Publication title:
- Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices
- Title of ser.:
- NATO science series. Series 2, Mathematics, physics and chemistry
- Ser. no.:
- 220
- Pub. Year:
- 2006
- Page(from):
- 189
- Page(to):
- 203
- Pages:
- 15
- Pub. info.:
- Dordrecht: Springer
- ISBN:
- 9781402043659 [1402043651]
- Language:
- English
- Call no.:
- N17050/220
- Type:
- Conference Proceedings
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