Blank Cover Image

Defect-related Issues in High-Dielectics

Author(s):
Pantelides, S. T
Evans, M. H
Fleetwood, D. M
Gusev, E. P
Joannopoulos, J. D
Lu, Z
Pennycook, S. J
Rashkeev, S. N
Schrimpf, R. D
Tsetseris, L
5 more
Publication title:
Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
220
Pub. Year:
2006
Page(from):
189
Page(to):
203
Pages:
15
Pub. info.:
Dordrecht: Springer
ISBN:
9781402043659 [1402043651]
Language:
English
Call no.:
N17050/220
Type:
Conference Proceedings

Similar Items:

1 Conference Proceedings Field-Induced Reactions of Water Molecules at Si-Dielectric Interfaces

Tsetseris, L., Zhou, X., Fleetwood, D. M., Schrimpf, R. D., Pantelides, S. T.

Materials Research Society
7 Conference Proceedings *THE ENCHANTING PROPERTIES OF OXYGEN ATOMS IN SILICON

Needels, M., Joannopoulos, J.D., Bar-Yam, Y., Pantelides, S.T., Wolfe, R.H.

Materials Research Society
2 Conference Proceedings Si/SiO2 and SiC/SiO2 Interfaces for MOSFETs - Challenges and Advances

Pantelides, S.T., Wang, S., Franceschetti, A., Buczko, R., Di Ventra, M., Rashkeev, S.N., Tsetseris, L., Evans, M.H., …

Trans Tech Publications
8 Conference Proceedings Structural and Mechanical Properties of Boron Nanotubes

Evans, Matthew H., Joannopoulos, John D., Pantelides, Sokrates T.

Materials Research Society
3 Conference Proceedings Hydrogen Model for Negative Bias Temperature Instabilities in MOS Gate Dielectrics

Fleetwood, D.M., Zhou, X.J., Tsetseris, L., Pantelides, S.T., Schrimpf, R.D.

Electrochemical Society
9 Conference Proceedings Recent radiation issues in silicon-on-insulator devices

Alles, M.L., Ball, D.R., Schrimpf, R.D., Fleetwood, D.M., Reed, R.A., Jun, B.

Electrochemical Society
4 Conference Proceedings Dipoles in SiO2: Border Traps or Not?

Fleetwood, D.M., Rashkeev, S.N., Lu, Z.Y., Nicklaw, CJ., Felix, JA., Schrimpf, R.D., Pantelides, S.T.

Electrochemical Society
10 Conference Proceedings Investigation of second-harmonic generation for SOI wafer metrology

Pasternak, R., Jun, B., Schrimpf, R.D., Fleetwood, D.M., Alles, M.A., Dolan, R.P., Standley, R.W., Tolk, N.H.

Electrochemical Society
5 Conference Proceedings Atomic-Scale Simulations of Electron Mobilities in Ultrathin SOI MOSFETs

S. T. Pantelides, G. Hadjisavvas, M. Evans, L. Tsetseris, M. Caussanel, R. Schrimpf

Electrochemical Society
11 Conference Proceedings Chromium and Lanthanum on Transition Alumina Surfaces : The Role of Bulk Point-Defect Distributions on Catalytic

Rasnkeev, S.N., Sohlberg, K., Glazoff, M.V., Novak, J., Pennycook, S.J., Pantelides, S.T.

Materials Research Society
6 Conference Proceedings The Origin of Electrical Activity at Grain Boundaries in Perovskites and Related Materials

Pennycook, S.J., Kim, M., Duscher, G., Browning, N.D., Sohlberg, K., Pantelides, S. T.

Materials Research Society
12 Conference Proceedings Nanoscale Structure/Property Correlation Through Aberration-Corrected STEM and Theory

Pennycook, S.J., Lupini, A.R., Varela, M., Borisevich, A., Chisholm, M.F., Abe, E., Dellby, N., Krivanek, O.L., Nellist, …

Materials Research Society
1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12