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Impact of High-k Properties on MOSFET Electrical Characteristics

Author(s):
Pantisano, Ll.
Ragnarsson, L. -A.
Houssa, M.
Degraeve, R.
Groeseneken, G.
Schram, T.
Degendt, S.
Heyns, M.
Afanas'ev, V.
4 more
Publication title:
Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
220
Pub. Year:
2006
Page(from):
97
Page(to):
109
Pages:
13
Pub. info.:
Dordrecht: Springer
ISBN:
9781402043659 [1402043651]
Language:
English
Call no.:
N17050/220
Type:
Conference Proceedings

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