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Characterization and modeling of Defects in High-k Layers Through Fast Electrical Transient Measurements

Author(s):
Mitard, J.
Leroux, C.
Reimbold, G.
Garros, X.
Martin, F.
Ghibaudo, G.
1 more
Publication title:
Defects in high-κ gate dielectric stacks : nano-electronic semiconductor devices
Title of ser.:
NATO science series. Series 2, Mathematics, physics and chemistry
Ser. no.:
220
Pub. date:
2006
Page(from):
73
Page(to):
85
Pages:
13
Pub. info.:
Dordrecht: Springer
ISBN:
9781402043659 [1402043651]
Language:
English
Call no.:
N17050/220
Type:
Conference Proceedings

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