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Bias Stress-Induced Threshold-Voltage Instability of SiC MOSFETs

Author(s):
Lelis, A.J.
Habersat, D.B.
Lopez, G.
McGarrity, J.M.
McLean, F.B.
Goldsman, N.
1 more
Publication title:
Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005
Title of ser.:
Materials science forum
Ser. no.:
527-529
Pub. date:
2006
Pt.:
2
Page(from):
1317
Page(to):
1320
Pages:
4
Pub. info.:
Stafa-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878494255 [0878494251]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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