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Microwave Dielectric Loss Characterization of Silicon Carbide Wafers

Author(s):
Bogart, T.
Everson, B.
Gamble, R.D.
Oslosky, E.
Snyder, D.W.
Furman, E.
Perini, S.
Lanagan, M.
3 more
Publication title:
Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005
Title of ser.:
Materials science forum
Ser. no.:
527-529
Pub. date:
2006
Pt.:
1
Page(from):
733
Page(to):
738
Pages:
6
Pub. info.:
Stafa-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878494255 [0878494251]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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