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Characterization of SiC Substrates Using X-Ray Rocking Curve Mapping

Author(s):
Yoganathan, M.
Emorhokpor, E.
Kerr, T.
Gupta, A.
Tanner, C.D.
Zwieback, I.
1 more
Publication title:
Silicon carbide and related materials - 2005 : proceedings of the International Conference on Silicon Carbide and Related Materials - 2005 : Pittsburgh, Pennsylvania, USA : September 18-23 2005
Title of ser.:
Materials science forum
Ser. no.:
527-529
Pub. date:
2006
Pt.:
1
Page(from):
729
Page(to):
732
Pages:
4
Pub. info.:
Stafa-Zuerich: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878494255 [0878494251]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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