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Specific Corrections Associated to Linear CCD Detectors Used in X-Ray Diffraction

Author(s):
Publication title:
Residual stresses VII : ECRS 7 : proceedings of the 7th European conference on residual stresses, Berlin, Germany, 13-15 September 2006
Title of ser.:
Materials science forum
Ser. no.:
524-525
Pub. Year:
2006
Page(from):
761
Page(to):
768
Pages:
8
Pub. info.:
Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878494149 [0878494146]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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