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Radiological Characterization of Semiconductor Materials in Field Effect Transistor Dosimeter by Monte Carlo Method

Author(s):
Publication title:
Recent developments in advanced materials and processes : selected papers presented at the 7th Conference of the Yugoslav Materials Research Society, held in Herceg Novi, Serbia and Montenegro, September 12-16, 2005
Title of ser.:
Materials science forum
Ser. no.:
518
Pub. Year:
2006
Page(from):
361
Page(to):
366
Pages:
6
Pub. info.:
Uetikon-Zurich, Switzerland: Trans Tech Publications
ISSN:
02555476
ISBN:
9780878494057 [0878494057]
Language:
English
Call no.:
M23650
Type:
Conference Proceedings

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